Reliability of PWB Microvias for High Density Package Assembly Body of Knowledge (BOK)
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Reliability Assessment of Voided Microvias in High Density Interconnect Printed Circuit Boards under Thermo Mechanical Stresses
Title of Document: RELIABILITY ASSESSMENT OF VOIDED MICROVIAS IN HIGH DENSITY INTERCONNECT PRINTED CIRCUIT BOARDS UNDER THERMO MECHANICAL STRESSES Roozbeh Bakhshi, Master of Science, 2013 Directed By: Professor Michael Pecht, Department of Mechanical Engineering Microvias allow signal and power transmission between layers in high density interconnection printed circuit boards. Presence of voidi...
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The advancement of area-array packages, such as flip chips and chip scale packages, has driven the adoption of high density interconnects (HDIs) that allow for an increased number of I/Os with a smaller footprint area. HDI substrates and printed circuit boards use microvias as interconnects between conductor layers. HDIs have evolved from single-level microvias to stacked microvias that travers...
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